U., Ferri, F., Giglio, M., Optical Particle Sizer Based on the Chahine Inversion Scheme, Opt. C., Optimizing the Kernel for Laser Diffraction Particle Sizing, App. Mühlenweg, H., Weichert, R., Optical Particle Sizer: A New Development with Mathematical Correlation of Spread Measurement Data, Part. D., Optimal Scaling of the Inverse Fraunhofer Diffraction Particle Sizing Problem: the Linear System Produced by Quadrature, Part. Mroczka, J., Method of Moments in Light Scattering Data Inversion in the Particle Size Distribution Function, Optics Comm., 1993, 99, 147–151. P., Knight, J., Roberston, G., Alternative Model-Independent Inversion Programme for Malvern Particle Sizer, Part. M., Esposito, E., Zikikout, S., Particle Sizing by Laser Light Diffraction: Improvements in Optics and Algorithms, Part. Ya., The Determination of the Spectrum of Particles in Dispersed System from Data on Its Transparency, Opt. Dissertation, George Washington Uni., Washington D. H., Particle Size Analysis Using Integral Transform Techniques on Fraunhofer Diffraction Pattern, D. M, Tribus, M., Particle Size Distribution from Angular Variation of Intensity of Forward-scattering Light, J. Y., Solution of Ill-posed Problems, Winston, Washington D.C., 1977.Ĭhin, J. D., Reticles as Standards in Laser Diffraction Spectroscopy, Part. Product Specification, Diffraction Reference Reticle, Malvern Instrument, Malvern, 1993.Ĭao, J., Watson, D., Diffraction Patterns of Static Particles on a 2-D Surface, Part. Part I: General Principle, International Organization of Standardization, Genève, 1999.įor example, Duke Scientific, Palo Alto, CA. ISO 13320-1 Particle Size Analysis-Laser Diffraction Methods. Xu, R., Reference Materials in Particle Measurement, in Liquid and Surface-Borne Particle Measurement Handbook, Eds. Wang, N., Shen, J., A Study of the Influence of Misalignment on Measuring Results for Laser Particle Analyzers, Part. Lehner, D., Kellner, G., Schnablegger, H., Clatter, O., Static Light Scattering on Dense Colloidal Systems: New Instrumentation and Experimental Results, J. Leschonski, K., Röthele, S., Menzel, U., A Special Feeder for Diffraction Pattern Analysis of Dry Powders, Part. A., Method and Apparatus for Dry Particle Analysis, US Patent 5, 359, 907, 1994. Inaba, K., Matsumoto, K., the Measurement of Particle Concentration using a Laser Diffraction Particle Size Analyzer, J. G., Direct Measurement of Concentration and Size for Particles of Different Shapes using Laser Light Diffraction, Ghent. J., Laser Diffraction Spectrometry: Fraunhofer Diffraction Versus Mie Scattering, Part. J., de Weerd, C., Thoenes, D., Goossens, H. Szychter, H., Cilas Particle Size Analyzer 1180: How to Measure Coarse and Fine Particles at the Same Time with a Video Camera and a Short Bench, Powder Handling and Processing, 1998, 10, 412–413.ĭe Boer, G. Series 693, American Chemical Society, Washington D. L., Capturing Static Light Scattering Data Using a High Resolution Charge-Coupled Device Detector, in Particle Size Distribution III, Ed. N., Methods and Apparatus for Determining Small Particle Size Distribution Utilizing Multiple Light Beams, US Patent 5, 416, 580, 1995.Ĭonklin, W. H., Method and Apparatus for Particle Size Analysis, US Patent 5,056,918, 056, 918, 1991. H., Laser Diffraction Particle Sizing Method Using a Monomode Optical Fiber, US Patent 5, 610, 712, 1997.īott, S. Toyoda, M., Laser Diffraction Particle Size Distribution Measurement Instrument: Coulter LS and Its Application to Pigment Particles, The Industrial Coating (Japan), 1998, 151, 30–34. H., Particle Size Analysis Utilizing Polarization Intensity Differential Scattering, US Patent 5, 104, 221, 1992. H., Particle Size Analysis Utilizing Polarization Intensity Differential Scattering, US Patent 4, 953, 978, 1990.īott, S. Series 472, American Chemical Society, Washington D. H., Extremely Wide Dynamic Range, High-Resolution Particle Sizing by Light Scattering, in Particle Size Distribution II, Ed. H., Mehnert, W., Medpharm Scientific Publishers, Stuttgart, 1997, Chpt.3, pp.27–56.īott, S. Xu, R., Improvement in Particle Size Analysis Using Light Scattering, in Particle and Surface Characterization Methods, Eds. Igushi, T., Togawa, Y., Apparatus for Simultaneously Measuring Large and Small Particle Size Distribution, US Patent 5, 185, 641, 1993. Witt, W., Röthele, S., Laser Diffraction-Unlimited? Part.
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